Phase identification from available XRD data
Quick qualitative overview of the sample’s mineralogical composition
What it is:
This service provides qualitative phase identification from XRD data measured by the client. The analysis is based on pattern matching against a comprehensive crystallographic reference database, allowing determination of crystalline phases present in the sample. Note: closely related or polymorphic phases may require high-quality data for unambiguous identification.
Best suited for:
• Preliminary material screening
• Exploration and drill core triage
• Supporting complementary geochemical or SEM/EDS analyses
• Situations where quantitative data is not essential
Output includes:
• List of identified phases
• Match quality (e.g., similarity scores, peak matches)
• Optional diffractogram with peak markers and brief interpretation summary
Turnaround time:
1 business day from data submission
Phase identification + Rietveld analysis from available XRD data
Quantitative mineralogical composition from your own measurements
What it is:
A full mineralogical analysis combining qualitative phase identification with quantitative Rietveld refinement, using available raw XRD data. This yields detailed phase proportions (in weight %) and refinement quality metrics. No preprocessing or manual phase selection is required from the client.
Best suited for:
• Routine process monitoring
• Quality control of flotation or concentrate samples
• Grade control and plant optimization
• Any case requiring reliable and repeatable quantification
Output includes:
• Identified mineral phases with quantitative proportions
• Full Rietveld refinement profile and residuals
• Visualized diffractogram with model fit overlay
Turnaround time:
Typically within 1 business day (depending on data quality and format)
Phase identification + Rietveld analysis from synchrotron-measured data
High-resolution mineralogical analysis using synchrotron XRD
What it is:
This is our most advanced mineralogical analysis. The sample is measured using synchrotron radiation, enabling identification of minor, poorly crystalline, or overlapping phases that may not be resolved by conventional lab diffractometers. Synchrotron sources also allow ultra-fast acquisition — typically 7–15 seconds per sample— while providing exceptional signal-to-noise and angular resolution. The resulting high-resolution data is subjected to full Rietveld refinement for accurate and reproducible quantification.
Best suited for:
• Early-stage exploration and deposit modeling
• Complex or fine-grained mineral assemblages
• Research and development projects
• Situations requiring maximum sensitivity and resolution
Output includes:
• High-precision quantitative phase composition
• Advanced Rietveld refinement
• Support for academic publication or technical reporting
Turnaround time:
Dependent on beamtime scheduling and logistics (typically planned over several weeks)